Patent Sonde für aperturlose Nahfeldmikroskopie und/oder für Ramanspektroskopie

Basic data

Title:
Sonde für aperturlose Nahfeldmikroskopie und/oder für Ramanspektroskopie
Reference number (DPMA):
20 2010 013 458.7
Primary registration:
23/09/2010
Approval:
30/12/2010

Inventors

Faculty of Science
University of Tübingen
Institute of Applied Physics (IAP)
Department of Physics, Faculty of Science

Local organizational units

Institute of Applied Physics (IAP)
Department of Physics
Faculty of Science
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