Project cryo-FIB-SEM – Cryogenic focused ion beam scanning electron microscope

Basic data

Acronym:
cryo-FIB-SEM
Title:
Cryogenic focused ion beam scanning electron microscope
Duration:
10/07/2018 to 10/07/2022
Abstract / short description:
The proposed cryogenic, focused ion beam, scanning electron microscope (cryo-FIB-SEM) will combine cryogenic preservation techniques with high resolution imaging, and advanced analytical methods into a single instrument. This unique configuration will further cement The University of Tuebingen at the heart of developments in environmental, biological and life sciences within Germany and the world. The instrument itself is capable of a wide range of applications which will be used to resolve the aggregation properties of microbes with minerals in the environment, study the movements of joints in insect appendages, develop understanding of the repeating crystal units that make up shells and fossils, probe electron carrying capacity of biological nanowires which are generated by bacteria, and many other exciting research frontiers.
Keywords:
electron microscopy
Elektronenmikroskopie

Involved staff

Managers

Faculty of Science
University of Tübingen
Center for Applied Geoscience
Department of Geoscience, Faculty of Science

Local organizational units

Center for Applied Geoscience
Department of Geoscience
Faculty of Science

Funders

Bonn, Nordrhein-Westfalen, Germany
Help

will be deleted permanently. This cannot be undone.