Project UPS-XRAY – Struktur und elektronische Zustandsdichte an Grenzflächen organischer Halbleiter

Basic data

Acronym:
UPS-XRAY
Title:
Struktur und elektronische Zustandsdichte an Grenzflächen organischer Halbleiter
Duration:
01/01/2016 to 31/12/2018
Abstract / short description:
This project aims to determine the electronic level alignment at the interface of two organic semiconductors (OSC). We will conduct a comprehensive study of the electronic level alignment of organic-organic (small molecule) heterostructures to understand the relationship between structural defects and electronic structure. The innovative combination of high-resolution X-ray scattering and high sensitivity UPS allows the detailed description of structural defects and electronic states located in the gap region, which are believed to play an essential role in the level alignment.
Keywords:
Ultraviolet Photoelectron Spectroscopy
X-ray scattering
Organic interfaces
Electronic level alignment

Staff

Managers

Institute of Applied Physics (IAP)
Department of Physics, Faculty of Science

Local organizational units

Institute of Applied Physics (IAP)
Department of Physics
Faculty of Science

Funders

Bonn, Nordrhein-Westfalen, Germany
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